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SEM and X-Ray Microanalysis Courses

Our aim in running these courses is to give an overview of X-ray Microanalysis Techniques including Energy Dispersive Analysis, Wavelength Dispersive Analysis. Since the courses are 'hands-on', the number of participants is strictly limited, so please register your application early. Contact Ken Moran for an application form ken@moranscientific.com.au The next SEM, EDS, XRM Course in 2010:April 13th, 14th and 15th. This course will be conducted at the University of Technology Sydney. Microstructural Analysis Unit Level 1, Building 4, Cnr Thomas & Harris Sts, Ultimo, NSW 2007 Typical Course Content (dependant on subject and level of participant): SEM: The SEM section aims to develop high level scientific and technical skills of direct relevance to anyone embarking the study of specimens at the microscopic level, or the evaluation, testing or analysis of a wide range of materials. Course participants will learn about basic operation of SEM’s and ESEM’s (environmental scanning electron microscopes). In this section a considerable proportion of their time learning to be competent operators of a SEM, measuring and analysing experimental data, and discussing strategies for accurate interpretation. Five SEMs, within the UTS Microstructural Analysis Unit, are available for “hands-on” training and laboratory sessions. EDS: Determination of keV, Resolution VS Count rate, CuL to CuK ratio, Calibration, Pulse Pile up, Spectra comparison, Labelling and Peak Identification, Take-off Angle and Sample Placement Requirements and Positioning, Looking for Artifacts, Specimen Preparation Techniques, Standards, Coating Requirements, Report Software. Quantitation: Spectrum stripping and Overlap correction, Deadtime correction, Standardless v's Standards analysis, Major and Trace Element Analysis, Quantitative Element Analysis, Thin film Corrections, Pseudo Standards, Light Element Analysis. WDS: Wavelength scans, Peak resolution c.f. EDS, Peak to Background Ratios compared to EDS, Detection Limits, X-Ray count chain electronics, Peak and Background Measurement Positions, Pulse Height Determinations, Mechanical requirements such as 'Which crystal and detector type to use for which elements?', Standards Selection, Standardisation and Analysis Techniques including Major and Trace Quantitative Element Analysis, Combined EDS / WDS Analysis, Light Element Analysis, XRM: Collection Strategies, Display of Data, Major and Trace Quantitative Element Analysis, Quantitative Mapping and Line Profiles, Detection Limits, Combined EDS / WDS Mapping, Light Element Mapping, Chemical Imaging * Demonstrations and hands-on will be undertaken on UTS Instrumentation. * If you are having trouble analysing a particular specimen, bring it along with you.

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For more information email: ken@moranscientific.com.au

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